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KLA UV-1280SE

1. System Dimensions (Inches)：58×37 1/4×66
2. 3.5" floppy installed
3. 15 inch LCD monitor
4. Summit 2.62.06.
5. Network Interface Card Installed.
6. Fully Refurbished to OEM Specifications.
7. Vintage：2000.
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DETAIL

Cognex 5400 Patmax System

Options: (DBS) Dual Beam Spectrometer & (SE) Spectroscopic Ellipsometer

Measures Film Thickness, Refractive Index (RI) and Extinction Coefficient of Single and Multi-Layer Thin Film Stacks Simultaneously

Reflectivity Range of 220 nm to 800 nm

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