Triple Glory Products

Products

Categories Title Description
Metrology AMAT Vera SEM 3D 1. Automated CD Metrology System.
2. Vintage:2001.
3. Wafer size:12 inch.
Metrology AMAT Vera SEM 3D 1. Automated CD Metrology System.
2. Vintage:2002.
3. Wafer size:12 inch.
Metrology KLA UV-1280SE 1. 150mm-200mm Wafers.
2. Measures Film Thickness.
3. Refractive Index and Extinction Coefficient.
Metrology KLA / Filmetrics F20 1. The film thickness measurement.
2. Manufacture Time:2021.
3. Working condition.