Triple Glory Products

Products

Categories Title Description
Etch Canon-ANELVA ILD-4100SR 1. Oxide Dry Etch
2. Vintage : 1996
3. Wafer Size : 200 mm
Etch TEL Etch TE-8401 1. Si Dry Etch
2. Vintage : 1992
3. Wafer Size : 200 mm
Metrology Rudolph AXI-935 Defect Inspection 1. Macro Inspection System
2. Vintage : 2007
3. Wafer Size : 300 mm
Metrology Rudolph FE-IV 1.Thickness measurement .
2. Model: FE-IV
3. Application 200 mm
Metrology Alcatel Adixen DGC 1001 Helium Leak Detector 1. Helium Detector
2. Model: DGC1001
3. Maker : Alcatel / Adixen
LED tester Bobble Detector 1. Bobble Leak Detector
2. Model: 1014-CBL
3. Maker : Intertest
Etch TEL Etch SCCM 1. Oxide Etcher.
2. Vintage:2006
3. Wafer size:12 inch.
Etch TEL Etch Telius 3055SS 1. Oxide Etcher.
2. Vintage:2001
3. Wafer size:12 inch.
Furnace / Oxide / LPCVD TEL Indy Plus 1. Poly Furnace.
(Zro HiK process)
2. Vintage:2009
3. Wafer size:12 inch
Furnace / Oxide / LPCVD TEL Indy 1. DPoly Furnace.
2. Vintage:2007
3. Wafer size:12 inch
Furnace / Oxide / LPCVD TEL Formula 1. DPOLY Furnace.
2. Vintage:2009
3. Wafer size:12 inch
Furnace / Oxide / LPCVD TEL Formula 1. NIT Furnace.
2. Vintage:2007
3. Wafer size:12 inch