Triple Glory Products

Products

Categories Title Description
Metrology NIKON NWL860 WAFER LOADER Wafer inspection
With loader.
Sold As Is
Metrology RUDOLPH FE-VIID Defect inspection system

Dual Wavelength

S/N : 10727 , Vintage :2002 ,
Pump / RF Rack /Chiller RF Rack 1.AD TEC Ax-1000LFIII
Pump / RF Rack /Chiller Dry Pump 1 .Ebara A07V Dry Pump
2. Ebara 40 Dry Pump
3. Edward QDP80 Dry Pump
4. Kashiyama SD609 Dry Pump
5. Kashiyama SDE2003B Dry Pump
6. Ulvac PRC-012A+ PDR-090B Dry Pump
7. EELQ-8ZT Dry Pump
IC Backend Origin JPF-3A Cap sealing 1. Cap sealing machines.
2. Vintage : 2003
3. As Is
IC Backend LTX-credence - Fusion CX 1. Mixed signal tester
Etch Canon-ANELVA ILD-4100SR 1. Oxide Dry Etch
2. Vintage : 1996
3. Wafer Size : 200 mm
Etch TEL Etch TE-8401 1. Si Dry Etch
2. Vintage : 1992
3. Wafer Size : 200 mm
Metrology Rudolph AXI-935 Defect Inspection 1. Macro Inspection System
2. Vintage : 2007
3. Wafer Size : 300 mm
Metrology Rudolph FE-IV 1.Thickness measurement .
2. Model: FE-IV
3. Application 200 mm
Metrology Alcatel Adixen DGC 1001 Helium Leak Detector 1. Helium Detector
2. Model: DGC1001
3. Maker : Alcatel / Adixen
Metrology Bobble Detector 1. Bobble Leak Detector
2. Model: 1014-CBL
3. Maker : Intertest