Triple Glory Products

Products

Categories Title Description
Metrology NIKON NWL860 WAFER LOADER Wafer inspection
With loader.
Sold As Is
Metrology RUDOLPH FE-VIID Defect inspection system

Dual Wavelength

S/N : 10727 , Vintage :2002 ,
Metrology Rudolph AXI-935 Defect Inspection 1. Macro Inspection System
2. Vintage : 2007
3. Wafer Size : 300 mm
Metrology Rudolph FE-IV 1.Thickness measurement .
2. Model: FE-IV
3. Application 200 mm
Metrology Alcatel Adixen DGC 1001 Helium Leak Detector 1. Helium Detector
2. Model: DGC1001
3. Maker : Alcatel / Adixen
Metrology Bobble Detector 1. Bobble Leak Detector
2. Model: 1014-CBL
3. Maker : Intertest
Metrology AMAT Vera SEM 3D 1. Automated CD Metrology System.
2. Vintage:2002.
3. Wafer size:12 inch.
Metrology AMAT Vera SEM 3D 1. Automated CD Metrology System.
2. Vintage:2001.
3. Wafer size:12 inch.
Metrology KLA UV-1280SE 1. 150mm-200mm Wafers.
2. Measures Film Thickness.
3. Refractive Index and Extinction Coefficient.