Triple Glory Products
Products
| Categories | Title | Description |
|---|---|---|
| Metrology | NIKON NWL860 WAFER LOADER |
Wafer inspection With loader. Sold As Is |
| Metrology | RUDOLPH FE-VIID |
Defect inspection system Dual Wavelength S/N : 10727 , Vintage :2002 , |
| Metrology | Rudolph AXI-935 Defect Inspection |
1. Macro Inspection System 2. Vintage : 2007 3. Wafer Size : 300 mm |
| Metrology | Rudolph FE-IV |
1.Thickness measurement . 2. Model: FE-IV 3. Application 200 mm |
| Metrology | Alcatel Adixen DGC 1001 Helium Leak Detector |
1. Helium Detector 2. Model: DGC1001 3. Maker : Alcatel / Adixen |
| Metrology | Bobble Detector |
1. Bobble Leak Detector 2. Model: 1014-CBL 3. Maker : Intertest |
| Metrology | AMAT Vera SEM 3D |
1. Automated CD Metrology System. 2. Vintage：2002. 3. Wafer size：12 inch. |
| Metrology | AMAT Vera SEM 3D |
1. Automated CD Metrology System. 2. Vintage：2001. 3. Wafer size：12 inch. |
| Metrology | KLA UV-1280SE |
1. 150mm-200mm Wafers. 2. Measures Film Thickness. 3. Refractive Index and Extinction Coefficient. |