Triple Glory Products

Products

Categories Title Description
Metrology Rudolph NSX105 (Parts Machine) Illumination, Dark Field, Source Assy
NSX105 Flash Pack
Power Box
DF Source
Metrology NIKON NWL860 WAFER LOADER ( Parrs Machine ) Wafer inspection
With loader.
Sold As Is
Metrology RUDOLPH FE-VIID Defect inspection system

Dual Wavelength

S/N : 10727 , Vintage :2002 ,
Metrology Rudolph AXI-935 Defect Inspection 1. Macro Inspection System
2. Vintage : 2007
3. Wafer Size : 300 mm
Metrology Rudolph FE-IV 1.Thickness measurement .
2. Model: FE-IV
3. Application 200 mm
Metrology Alcatel Adixen DGC 1001 Helium Leak Detector 1. Helium Detector
2. Model: DGC1001
3. Maker : Alcatel / Adixen
Metrology KLA UV-1280SE 1. 150mm-200mm Wafers.
2. Measures Film Thickness.
3. Refractive Index and Extinction Coefficient.
Metrology KLA / Filmetrics F20 1. The film thickness measurement.
2. Manufacture Time:2021.
3. Working condition.